검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Adhesion quality of evaporated aluminum layers on passivation layers for rear metallization of silicon solar cells Kumm J, Hartmann P, Eberlein D, Wolf A Thin Solid Films, 612, 393, 2016 |
| 2 |
CVD Al PVD Al integration for advanced via and interconnect technology Beinglass I, Naik M Thin Solid Films, 320(1), 35, 1998 |
| 3 |
Thin-Film Microstructure Modeling Through Line-Segment Simulation Friedrich LJ, Dew SK, Brett M, Smy T Thin Solid Films, 266(1), 83, 1995 |
| 4 |
Dependence of Resolution on Sample Material in Rotational Auger Depth Profiling Tanemura M, Okuyama F Journal of Vacuum Science & Technology A, 12(3), 794, 1994 |
| 5 |
Auger-Electron Spectroscopy Rotational Depth Profiling of Ni Cr Multilayers Using O2+ and Ar+ Ions Zalar A, Seibt EW, Panjan P Thin Solid Films, 246(1-2), 35, 1994 |