1 |
In situ investigations of electrogenerated polybithiophene film growth on indium tin oxide substrate using optical fixed-angle reflectometry Monnin AF, Buron CC, Guyard L, Filiatre C Thin Solid Films, 522, 104, 2012 |
2 |
Contact angle determination of nanoparticles: Real experiments and computer simulations Agod A, Deak A, Hild E, Horvolgyi Z, Kalman E, Tolnai G, Kovacs AL Journal of Adhesion, 80(10-11), 1055, 2004 |
3 |
Potentiality of reflectometry for the study of the adsorption on dielectric and metal substrates: Application to the adsorption of polyvinylimidazole on silica and gold Roques-Carmes T, Membrey F, Filiatre C, Foissy A Journal of Colloid and Interface Science, 245(2), 257, 2002 |
4 |
In situ determination of the structural properties of initially deposited polyelectrolyte multilayers Ladam G, Schaad P, Voegel JC, Schaaf P, Decher G, Cuisinier F Langmuir, 16(3), 1249, 2000 |
5 |
Kinetics of particle adsorption in stagnation point flow studied by optical reflectometry Bohmer MR, van der Zeeuw EA, Koper GJM Journal of Colloid and Interface Science, 197(2), 242, 1998 |
6 |
Kinetics and mechanism of cationic surfactant adsorption and coadsorption with cationic polyelectrolytes at the silica-water interface Pagac ES, Prieve DC, Tilton RD Langmuir, 14(9), 2333, 1998 |
7 |
Validity of the Uniform Thin-Film Approximation for the Optical Analysis of Particulate Films Mann EK, Heinrich L, Schaaf P Langmuir, 13(18), 4906, 1997 |
8 |
Optical-Properties of Surfaces Covered with Latex-Particles - Comparison with Theory Mann EK, Vanderzeeuw EA, Koper GJ, Schaaf P, Bedeaux D Journal of Physical Chemistry, 99(2), 790, 1995 |