검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
X-ray scattering analysis of interface roughness and diffusion Baribeau JM Journal of Vacuum Science & Technology B, 16(3), 1568, 1998 |
| 2 |
X-ray absorption at Ge L-3 edges as a tool to investigate Ge/Si(001) interfaces and heterostructures Castrucci P, Gunnella R, De Crescenzi M, Sacchi M, Dufour G, Rochet F Journal of Vacuum Science & Technology B, 16(3), 1616, 1998 |
| 3 |
X-ray scattering investigation of the interfaces in Si/Si1-xGex superlattices on Si(001) grown by MBE and UHV-CVD Baribeau JM, Lafontaine H Thin Solid Films, 321(1-2), 141, 1998 |