검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Consistency of calculated and measured electron inelastic mean free paths Powell CJ, Jablonski A Journal of Vacuum Science & Technology A, 17(4), 1122, 1999 |
| 2 |
Surface Nanostructure Determination by X-Ray Photoemission Spectroscopy Peak Shape-Analysis Tougaard S Journal of Vacuum Science & Technology A, 14(3), 1415, 1996 |
| 3 |
Spectroscopic Ellipsometry Investigation of Amorphous-Silicon Nitride Thin-Films Troliermckinstry S, Hu HG, Carim AH Journal of the Electrochemical Society, 141(9), 2483, 1994 |