검색결과 : 14건
| No. | Article |
|---|---|
| 1 |
Optical and structural characterization of Ge clusters embedded in ZrO2 Agocs E, Zolnai Z, Rossall AK, van den Berg JA, Fodor B, Lehninger D, Khomenkova L, Ponomaryov S, Gudymenko O, Yukhymchuk V, Kalas B, Heitmann J, Petrik P Applied Surface Science, 421, 283, 2017 |
| 2 |
Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions Agocs E, Kozma P, Nador J, Hamori A, Janosov M, Kalas B, Kurunczi S, Fodor B, Ehrentreich-Forster E, Fried M, Horvath R, Petrik P Applied Surface Science, 421, 289, 2017 |
| 3 |
Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires Fodor B, Defforge T, Agocs E, Fried M, Gautier G, Petrik P Applied Surface Science, 421, 397, 2017 |
| 4 |
Protein adsorption monitored by plasmon-enhanced semi-cylindrical Kretschmann ellipsometry Kalas B, Nador J, Agocs E, Saftics A, Kurunczi S, Fried M, Petrik P Applied Surface Science, 421, 585, 2017 |
| 5 |
Optical properties of Zr and ZrO2 Petrik P, Sulyok A, Novotny T, Perez-Fero E, Kalas B, Agocs E, Lohner T, Lehninger D, Khomenkova L, Nagy R, Heitmann J, Menyhard M, Hozer Z Applied Surface Science, 421, 744, 2017 |
| 6 |
Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride Fodor B, Cayrel F, Agocs E, Alquier D, Fried M, Petrik P Thin Solid Films, 571, 567, 2014 |
| 7 |
Resolving lateral and vertical structures by ellipsometry using wavelength range scan Petrik P, Agocs E, Volk J, Lukacs I, Fodor B, Kozma P, Lohner T, Oh S, Wakayama Y, Nagata T, Fried M Thin Solid Films, 571, 579, 2014 |
| 8 |
Approaches to calculate the dielectric function of ZnO around the band gap Agocs E, Fodor B, Pollakowski B, Beckhoff B, Nutsch A, Jank M, Petrik P Thin Solid Films, 571, 684, 2014 |
| 9 |
Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration Lohner T, Agocs E, Petrik P, Zolnai Z, Szilagyi E, Kovacs I, Szokefalvi-Nagy Z, Toth L, Toth AL, Illes L, Barsony I Thin Solid Films, 571, 715, 2014 |
| 10 |
Model dielectric function analysis of the critical point features of silicon nanocrystal films in a broad parameter range Agocs E, Nassiopoulou AG, Milita S, Petrik P Thin Solid Films, 541, 83, 2013 |