검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Accurate SIMS doping profiling of aluminum-doped solid-phase epitaxy silicon islands Civale Y, Nanver LK, Alberici SG, Gammon A, Kelly I Electrochemical and Solid State Letters, 11(4), H74, 2008 |
| 2 |
Phosphorous degassing from poly silicon under thermal exposure: A ToF-SIMS depth profile investigation Alberici SG, Piagge R Applied Surface Science, 252(19), 7272, 2006 |
| 3 |
Ti diffusion in chalcogenides: a ToF-SIMS depth profile characterization approach Alberici SG, Zonca R, Pashmakov B Applied Surface Science, 231-2, 821, 2004 |