검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
High-fidelity projective read-out of a solid-state spin quantum register Robledo L, Childress L, Bernien H, Hensen B, Alkemade PFA, Hanson R Nature, 477(7366), 574, 2011 |
| 2 |
Model for nanopillar growth by focused helium ion-beam-induced deposition Alkemade PFA, Chen P, van Veldhoven E, Maas D Journal of Vacuum Science & Technology B, 28(6), C6F22, 2010 |
| 3 |
Proximity effect in ion-beam-induced deposition of nanopillars Chen P, Salemink HWM, Alkemade PFA Journal of Vacuum Science & Technology B, 27(4), 1838, 2009 |
| 4 |
Method for improving the aspect ratio of ultrahigh-resolution structures in negative electron-beam resist Sidorkin VA, Alkemade PFA, Salemink HWM, Schmits R, van der Drift E Journal of Vacuum Science & Technology B, 27(6), 2503, 2009 |
| 5 |
Beam induced deposition of platinum using a helium ion microscope Sanford CA, Stern L, Barriss L, Farkas L, DiManna M, Mello R, Maas DJ, Alkemade PFA Journal of Vacuum Science & Technology B, 27(6), 2660, 2009 |
| 6 |
Roles of secondary electrons and sputtered atoms in ion-beam-induced deposition Chen P, Salemink HWM, Alkemade PFA Journal of Vacuum Science & Technology B, 27(6), 2718, 2009 |
| 7 |
Anisotropic growth of chromium films during sputter deposition on substrates in planetary motion Janssen GCAM, Alkemade PFA, Sivel VGM, Grachev SY, Kamminga JD Journal of Vacuum Science & Technology A, 22(4), 1773, 2004 |
| 8 |
Approach to the characterization of through-oxide boron implantation by secondary ion mass spectrometry Jiang ZX, Backer S, Lee JJ, Wu LY, Guenther T, Sieloff D, Choi P, Foisy M, Alkemade PFA Journal of Vacuum Science & Technology B, 19(4), 1133, 2001 |
| 9 |
Complex roughening of Si under oblique bombardment by low-energy oxygen ions Alkemade PFA, Jiang ZX Journal of Vacuum Science & Technology B, 19(5), 1699, 2001 |
| 10 |
Apparent depths of B and Ge deltas in Si as measured by secondary ion mass spectrometry Jiang ZX, Alkemade PFA, Tung CH, Wang JLF Journal of Vacuum Science & Technology B, 18(2), 706, 2000 |