검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
A 65 nm test structure for SRAM device variability and NBTI statistics Fischer T, Amirante E, Huber P, Hofmann K, Ostermayr M, Schmitt-Landsiedel D Solid-State Electronics, 53(7), 773, 2009 |
| 2 |
Simulation of a non-invasive charge detector for quantum cellular automata Iannaccone G, Ungarelli C, Macucci M, Amirante E, Governale M Thin Solid Films, 336(1-2), 145, 1998 |