검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection Sondena R, Hu Y, Juel M, Wiig MS, Angelskar H Journal of Crystal Growth, 367, 68, 2013 |
| No. | Article |
|---|---|
| 1 |
Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection Sondena R, Hu Y, Juel M, Wiig MS, Angelskar H Journal of Crystal Growth, 367, 68, 2013 |