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| No. | Article |
|---|---|
| 1 |
Real time spectroscopic ellipsometry for analysis and control of thin film polycrystalline semiconductor deposition in photovoltaics Koirala P, Attygalle D, Aryal P, Pradhan P, Chen J, Marsillac S, Ferlauto AS, Podraza NJ, Collins R Thin Solid Films, 571, 442, 2014 |