| 1 |
Impact of Auger recombination on performance limitation of perovskite solar cell
Chantana J, Kawano Y, Nishimura T, Mavlonov A, Shen Q, Yoshino K, Iikubo S, Hayase S, Minemoto T
Solar Energy, 217, 342, 2021 |
| 2 |
Modeling and analysis of the effects of inhomogeneous carrier distributions in InGaN multiple quantum wells
Ryu HY
Current Applied Physics, 20(12), 1351, 2020 |
| 3 |
Performance analysis and fate of bromine in a single screw reactor for pyrolysis of waste electrical and electronic equipment (WEEE)
Evangelopoulos P, Persson H, Kantarelis E, Yang WH
Process Safety and Environmental Protection, 143, 313, 2020 |
| 4 |
The Oscillatory Adsorption of Organosilane Films on Aluminium Oxide: Film Morphology using Auger Electron Spectromicroscopy
Sims RA, Harmer-Bassell SL, Quinton JS
Applied Surface Science, 475, 999, 2019 |
| 5 |
Effect of temperature and carrier gas on the properties of thick InxAl1-xN layer
Chauhan P, Hasenohrl S, Dobrocka E, Vanco L, Stoklas R, Kovac J, Siffalovic P, Kuzmil J
Applied Surface Science, 470, 1, 2019 |
| 6 |
Investigation of the dependence of phosphorus segregation on grain boundary structure in Fe-P-C alloy:.ross comparison between Atom Probe Tomography and Auger Electron Spectroscopy
Akhatova A, Christien F, Barnier V, Radiguet B, Cadel E, Cuvilly F, Pareige P
Applied Surface Science, 463, 203, 2019 |
| 7 |
Surface chemistry and composition-induced variation of laser interference-based surface treatment of Al alloys
Meyer HM, Sabau AS, Daniel C
Applied Surface Science, 489, 893, 2019 |
| 8 |
Auger electron spectroscopy and UV-Vis spectroscopy in combination with multivariate curve resolution analysis to determine the Cu2O/CuO ratios in oxide layers on technical copper surfaces
Stiedl J, Green S, Chasse T, Rebner K
Applied Surface Science, 486, 354, 2019 |
| 9 |
Morphology and element composition profiles of alumina films obtained by mixed thermal oxidation of AlN epitaxial layers
Domanowska A, Korbutowicz R, Teterycz H
Applied Surface Science, 484, 1234, 2019 |
| 10 |
Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy
Zemek J, Houdkova J, Jiricek P, Izak T, Kalbac M
Applied Surface Science, 491, 16, 2019 |
