검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
High-Precision X-Ray Reflectivity Study of Ultrathin SiO2 on Si Awaji N, Sugita Y, Nakanishi T, Ohkubo S, Takasaki K, Komiya S Journal of Vacuum Science & Technology A, 14(3), 971, 1996 |
| No. | Article |
|---|---|
| 1 |
High-Precision X-Ray Reflectivity Study of Ultrathin SiO2 on Si Awaji N, Sugita Y, Nakanishi T, Ohkubo S, Takasaki K, Komiya S Journal of Vacuum Science & Technology A, 14(3), 971, 1996 |