검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample Zborowski C, Renault O, Torres A, Yamashita Y, Grenet G, Tougaard S Applied Surface Science, 432, 60, 2018 |
| 2 |
First nucleation steps of vanadium oxide thin films studied by XPS inelastic peak shape analysis Gracia F, Yubero F, Espinos JP, Gonzalez-Elipe AR Applied Surface Science, 252(1), 189, 2005 |
| 3 |
Surface Nanostructure Determination by X-Ray Photoemission Spectroscopy Peak Shape-Analysis Tougaard S Journal of Vacuum Science & Technology A, 14(3), 1415, 1996 |