검색결과 : 3건
No. | Article |
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1 |
Hydrogen-related hole capture and positive charge build up in buried oxides Rivera A, van Veen A, Schut H, de Nijs JMM, Balk P Solid-State Electronics, 46(11), 1775, 2002 |
2 |
Native and irradiation-induced defects in SiO(2) structures studied by positron annihilation techniques Rivera A, Montilla I, Garcia AA, Galindo RE, Falub CV, van Veen A, Schut H, de Nijs JMM, Balk P Materials Science Forum, 363-3, 64, 2001 |
3 |
DIELECTRICS FOR FIELD-EFFECT TECHNOLOGY BALK P Advanced Materials, 7(8), 703, 1995 |