| 1 |
Mapping the interfacial reaction of alpha-Ga2O3 Schottky contacts through scanning internal photoemission microscopy
Shiojima K, Kambara H, Matsuda T, Shinohe T
Thin Solid Films, 685, 17, 2019 |
| 2 |
Fabrication of Schottky barrier diodes on clump of gallium nitride nanowires grown by chemical vapour deposition
Sanjay S, Baskar K
Applied Surface Science, 456, 526, 2018 |
| 3 |
Effect of V/III ratio on the surface morphology and electrical properties of m-plane (10(1)over-bar0) GaN homoepitaxial layers
Barry OI, Tanaka A, Nagamatsu K, Bae SY, Lekhal K, Matsushita J, Deki M, Nitta S, Honda Y, Amano H
Journal of Crystal Growth, 468, 552, 2017 |
| 4 |
Strong Fermi-level pinning induced by argon inductively coupled plasma treatment and post-metal deposition annealing on 4H-SiC
Tsui BY, Cheng JC, Yen CT, Lee CY
Solid-State Electronics, 133, 83, 2017 |
| 5 |
Reverse bias voltage dependent hydrogen sensing properties on Au-TiO2 nanotubes Schottky barrier diodes
Ling YH, Ren FJ, Feng JY
International Journal of Hydrogen Energy, 41(18), 7691, 2016 |
| 6 |
Investigation of temperature dependent electrical properties of Ni/Al0.26Ga0.74N Schottky barrier diodes
Akkaya A, Karaaslan T, Dede M, Cetin H, Ayyildiz E
Thin Solid Films, 564, 367, 2014 |
| 7 |
The effect of series resistance and interface states on the frequency dependent C-V and G/w-V characteristics of Al/perylene/p-Si MPS type Schottky barrier diodes
Zeyrek S, Acaroglu E, Altindal S, Birdogan S, Bubul MM
Current Applied Physics, 13(7), 1225, 2013 |
| 8 |
Gold nanoparticles deposited on linker-free silicon substrate and embedded in aluminum Schottky contact
Gorji MS, Razak KA, Cheong KY
Journal of Colloid and Interface Science, 408, 220, 2013 |
| 9 |
MBE grown Ga2O3 and its power device applications
Sasaki K, Higashiwaki M, Kuramata A, Masui T, Yamakoshi S
Journal of Crystal Growth, 378, 591, 2013 |
| 10 |
Analysis of electrical properties and deep level defects in undoped GaN Schottky barrier diode
Peta KR, Park BG, Lee ST, Kim MD, Oh JE, Kim TG, Reddy VR
Thin Solid Films, 534, 603, 2013 |
