화학공학소재연구정보센터
검색결과 : 19건
No. Article
1 Evidence of low injection efficiency for implanted p-emitters in bipolar 4H-SiC high-voltage diodes
Matthus CD, Huerner A, Erlbacher T, Bauer AJ, Frey L
Solid-State Electronics, 144, 101, 2018
2 High-mobility metal-oxide thin-film transistors by spray deposition of environmentally friendly precursors
Oertel S, Jank MPM, Teuber E, Bauer AJ, Frey L
Thin Solid Films, 553, 114, 2014
3 Feasibility and limitations of anti-fuses based on bistable non-volatile switches for power electronic applications
Erlbacher T, Huerner A, Bauer AJ, Frey L
Solid-State Electronics, 75, 33, 2012
4 Comprehensive study of focused ion beam induced lateral damage in silicon by scanning probe microscopy techniques
Rommel M, Spoldi G, Yanev V, Beuer S, Amon B, Jambreck J, Petersen S, Bauer AJ, Frey L
Journal of Vacuum Science & Technology B, 28(3), 595, 2010
5 Honeycomb voids due to ion implantation in germanium
Kaiser RJ, Koffel S, Pichler P, Bauer AJ, Amon B, Claverie A, Benassayag G, Scheiblin P, Frey L, Ryssel H
Thin Solid Films, 518(9), 2323, 2010
6 Effective work function engineering by lanthanide ion implantation of metal-oxide semiconductor gate stacks
Fet A, Haublein V, Bauer AJ, Ryssel H
Journal of Vacuum Science & Technology B, 27(1), 290, 2009
7 Correlation of microscopic and macroscopic electrical characteristics of high-k ZrSixO2-x thin films using tunneling atomic force microscopy
Weinreich W, Wilde L, Kucher P, Lemberger M, Yanev V, Rommel M, Bauer AJ, Erben E, Heitmann J, Schroder U, Oberbeck L
Journal of Vacuum Science & Technology B, 27(1), 364, 2009
8 Suppression of parasitic electron injection in silicon-oxide-nitride-oxide-silicon-type memory cells using high-k capping layers
Erlbacher T, Graf T, DasGupta N, Bauer AJ, Ryssel H
Journal of Vacuum Science & Technology B, 27(1), 482, 2009
9 Analysis of the DC-arc behavior of a novel 3D-active fuse
vom Dorp J, Berberich SE, Bauer AJ, Ryssel H
Solid-State Electronics, 53(7), 809, 2009
10 Neurobiological applications of small molecule screening
Bauer AJ, Stockwell BR
Chemical Reviews, 108(5), 1774, 2008