검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Compact modeling of CMOS transistors under variable uniaxial stress Wacker N, Richter H, Hassan MU, Rempp H, Burghartz JN Solid-State Electronics, 57(1), 52, 2011 |
| 2 |
Effect of technology scaling on the 1/f noise of deep submicron PMOS transistors Chew KW, Yeo KS, Chu SF Solid-State Electronics, 48(7), 1101, 2004 |
| 3 |
Development of a RF large signal MOSFET model, based on an equivalent circuit, and comparison with the BSIM3v3 compact model Vandamme EP, Schreurs D, van Dinther C, Badenes G, Deferm L Solid-State Electronics, 46(3), 353, 2002 |
| 4 |
Worst-case analysis and statistical simulation of MOSFET devices based on parametric test data Zhang Q, Liou JJ, McMacken J, Thomson JR, Stiles K, Layman P Solid-State Electronics, 45(9), 1537, 2001 |