| 1 |
Monitoring the Formation of a CH3NH3PbI3-xClx Perovskite during Thermal Annealing Using X-Ray Scattering
Barrows AT, Lilliu S, Pearson AJ, Babonneau D, Dunbar ADF, Lidzey DG
Advanced Functional Materials, 26(27), 4934, 2016 |
| 2 |
In situ optical spectroscopy during deposition of Ag:Si3N4 nanocomposite films by magnetron sputtering
Simonot L, Babonneau D, Camelio S, Lantiat D, Guerin P, Lamongie B, Antad V
Thin Solid Films, 518(10), 2637, 2010 |
| 3 |
Nanostructured sapphire vicinal surfaces as templates for the growth of self-organized oxide nanostructures
Thune E, Boulle A, Babonneau D, Pailloux F, Hamd W, Guinebretiere R
Applied Surface Science, 256(3), 924, 2009 |
| 4 |
Influence of polymer porogens on the porosity and mechanical properties of spin coated Ultra Low k dielectrics
Jousseaume V, Rolland G, Babonneau D, Simon JP
Thin Solid Films, 517(15), 4413, 2009 |
| 5 |
Structural study of nanoporous ultra low-k dielectrics using complementary techniques: Ellipsometric porosimetry, X-ray reflectivity and grazing incidence small-angle X-ray scattering
Jousseaume V, Rolland G, Babonneau D, Simon JP
Applied Surface Science, 254(2), 473, 2007 |
| 6 |
X-ray reflectivity, diffraction and grazing incidence small angle X-ray scattering as complementary methods in the microstructural study of sol-gel zirconia thin films
Lenormand P, Lecomte A, Babonneau D, Dauger A
Thin Solid Films, 495(1-2), 224, 2006 |
| 7 |
Correlations between the microstructure of Ag-Si3N4 multilayers and their optical properties
Girardeau T, Camelio S, Babonneau D, Toudert J, Barranco A
Thin Solid Films, 455-56, 313, 2004 |
| 8 |
Structural characteristics of copper/hydrogenated amorphous carbon composite films prepared by microwave plasma-assisted deposition processes from methane-argon and acetylene-argon gas mixtures
Thiery F, Pauleau Y, Grob JJ, Babonneau D
Thin Solid Films, 466(1-2), 10, 2004 |
| 9 |
Morphological study of cobalt aggregates in magnetic multilayers by grazing-incidence small-angle X-ray scattering
Naudon A, Babonneau D, Petroff F, Vaures A
Thin Solid Films, 319(1-2), 81, 1998 |
