| 1 |
Cu(In,Ga)(Se,Te)(2) films formed on metal foil substrates by a two-stage process employing electrodeposition and evaporation
Atasoy Y, Basol BM, Olgar MA, Tomakin M, Bacaksiz E
Thin Solid Films, 649, 30, 2018 |
| 2 |
Effect of heat treating metallic constituents on the properties of Cu2ZnSnSe4 thin films formed by a two-stage process
Olgar MA, Basol BM, Atasoy Y, Tomakin M, Aygun G, Ozyuzer L, Bacaksiz E
Thin Solid Films, 624, 167, 2017 |
| 3 |
Effect of precursor stacking order and sulfurization temperature on compositional homogeneity of CZTS thin films
Olgar MA, Klaer J, Mainz R, Levcenco S, Just J, Bacaksiz E, Unold T
Thin Solid Films, 615, 402, 2016 |
| 4 |
Cu(In,Ga)(Se,Te)(2) pentenary thin films formed by reaction of precursor layers
Atasoy Y, Basol BM, Polat I, Tomakin M, Parlak M, Bacaksiz E
Thin Solid Films, 592, 189, 2015 |
| 5 |
The influence of Cu-doping on structural, optical and photocatalytic properties of ZnO nanorods
Polat I, Yilmaz S, Altin I, Bacaksiz E, Sokmen M
Materials Chemistry and Physics, 148(3), 528, 2014 |
| 6 |
The influence of annealing temperature and tellurium (Te) on electrical and dielectrical properties of Al/p-CIGSeTe/Mo Schottky diodes
Fiat S, Polat I, Bacaksiz E, Kompitsas M, Cankaya G
Current Applied Physics, 13(6), 1112, 2013 |
| 7 |
The effect of metal work function on the barrier height of metal/CdS/SnO2/In-Ga structures
Tascioglu I, Altindal S, Polat I, Bacaksiz E
Current Applied Physics, 13(7), 1306, 2013 |
| 8 |
The influence of stoichiometry and annealing temperature on the properties of CuIn0.7Ga0.3Se2 and CuIn0.7Ga0.3Te2 thin films
Fiat S, Koralli P, Bacaksiz E, Giannakopoulos KP, Kompitsas M, Manolakos DE, Cankaya G
Thin Solid Films, 545, 64, 2013 |
| 9 |
ZnO and ZnS microrods coated on glass and photocatalytic activity
Altin I, Polat I, Bacaksiz E, Sokmen M
Applied Surface Science, 258(11), 4861, 2012 |
| 10 |
Structural, optical and magnetic properties of Ni-doped ZnO micro-rods grown by the spray pyrolysis method
Yilmaz S, McGlynn E, Bacaksiz E, Cullen J, Chellappan RK
Chemical Physics Letters, 525-26, 72, 2012 |
