검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
On the impact of silicon nitride technology on charge trap NAND memories Sebastiani A, Scozzari C, Mauri A, Modelli A, Albini G, Piagge R, Bacciaglia P, Del Vitto A, Alessandri M, Grossi A, Tessariol P, Ghidini G Journal of Vacuum Science & Technology B, 27(1), 490, 2009 |
| 2 |
Quantitative evaluation of iron at the silicon surface after wet cleaning treatments Caputo D, Bacciaglia P, Carpanese C, Polignano ML, Lazzeri P, Bersani M, Vanzetti L, Pianetta P, Moro L Journal of the Electrochemical Society, 151(5), G289, 2004 |