검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Ultrahigh resolution secondary ion mass spectrometry profiling with oblique O-2(+) beams below 200 eV Jiang ZX, Lerma J, Sieloff D, Lee JJ, Backer S, Bagchi S, Conner J Journal of Vacuum Science & Technology B, 22(2), 630, 2004 |
| 2 |
Characterization of advanced complementary metal-oxide-semiconductor processes with reverse secondary ion mass spectrometry profiling Jiang ZX, Lerma J, Lee JJ, Sieloff D, Chen S, Beck J, Backer S, Taylor W, Tseng H, Tobin P, Svedberg L Journal of Vacuum Science & Technology B, 21(4), 1487, 2003 |
| 3 |
Approach to the characterization of through-oxide boron implantation by secondary ion mass spectrometry Jiang ZX, Backer S, Lee JJ, Wu LY, Guenther T, Sieloff D, Choi P, Foisy M, Alkemade PFA Journal of Vacuum Science & Technology B, 19(4), 1133, 2001 |
| 4 |
Reduction in surface roughness during secondary ion mass spectrometry depth profiling with an ion-milling method Jiang ZX, Backer S, Chen S, Lerma J, Guenther T, Lee JJ, Sieloff D Journal of Vacuum Science & Technology B, 19(6), 2304, 2001 |
| 5 |
Solvent dependence of the hydrodynamical volume of dendrimers with a rubicene core De Backer S, Prinzie Y, Verheijen W, Smet M, Desmedt K, Dehaen W, De Schryver FC Journal of Physical Chemistry A, 102(28), 5451, 1998 |