검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Reduction of the dislocation density in molecular beam epitaxial CdTe(211)B on Ge(211) Badano G, Robin IC, Amstatt B, Gemain F, Baudry X Journal of Crystal Growth, 312(10), 1721, 2010 |
| 2 |
In situ real-time analysis of the MBE growth of CdTe on Ge: A comparison of ellipsometry data analysis techniques Badano G, Ballet P, Baudry X, Zanatta JP, Million A Journal of Crystal Growth, 296(2), 129, 2006 |
| 3 |
Composition and thickness distribution of HgCdTe molecular beam epitaxy wafers by infrared microscope mapping Chang Y, Badano G, Jiang E, Garland JW, Zhao J, Grein CH, Sivananthan S Journal of Crystal Growth, 277(1-4), 78, 2005 |
| 4 |
Defect characterization for epitaxial HgCdTe alloys by electron microscopy Aoki T, Chang Y, Badano G, Zhao J, Grein C, Sivananthan S, Smith DJ Journal of Crystal Growth, 265(1-2), 224, 2004 |
| 5 |
Accuracy of the in situ determination of the CdZnTe temperature by ellipsometry before the growth of HgCdTe by MBE Badano G, Garland JW, Sivananthan S Journal of Crystal Growth, 251(1-4), 571, 2003 |
| 6 |
Ellipsometric study of the nucleation of (211) HgCdTe on CdZnTe(211)B Badano G, Zhao J, Chang Y, Garland JW, Sivananthan S Journal of Crystal Growth, 258(3-4), 374, 2003 |
| 7 |
In situ monitoring of molecular-beam-epitaxy grown Hg1-xCdxTe by Fourier transform infrared spectroscopy Badano G, Daraselia M, Sivananthan S Journal of Vacuum Science & Technology B, 19(4), 1576, 2001 |