화학공학소재연구정보센터
검색결과 : 26건
No. Article
1 Real-time mass spectrometric characterization of the solid-electrolyte interphase of a lithium-ion battery
Zhou YF, Su M, Yu XF, Zhang YY, Wang JG, Ren XD, Cao RG, Xu W, Baer DR, Du YG, Borodin O, Wang YT, Wang XL, Xu K, Xu ZJ, Wang CM, Zhu ZH
Nature Nanotechnology, 15(3), 224, 2020
2 Atomic origins of water-vapour-promoted alloy oxidation
Luo LL, Su M, Yan PF, Zou LF, Schreiber DK, Baer DR, Zhu ZH, Zhou GW, Wang YT, Bruemmer SM, Xu ZJ, Wang CM
Nature Materials, 17(6), 514, 2018
3 Bulk Migration of Ni/NiO in Ni-YSZ during Reducing Conditions
Saraf LV, Baer DR, Lea AS, Zhu ZH, Strohm JJ, Sitzman SD, King DL
Journal of the Electrochemical Society, 157(4), B463, 2010
4 Comparison of the sputter rates of oxide films relative to the sputter rate of SiO2
Baer DR, Engelhard MH, Lea AS, Nachimuthu P, Droubay TC, Kim J, Lee B, Mathews C, Opila RL, Saraf LV, Stickle WF, Wallace RM, Wright BS
Journal of Vacuum Science & Technology A, 28(5), 1060, 2010
5 Morphology and Electronic Structure of the Oxide Shell on the Surface of Iron Nanoparticles
Wang CM, Baer DR, Amonette JE, Engelhard MH, Antony J, Qiang Y
Journal of the American Chemical Society, 131(25), 8824, 2009
6 Controlling size of gold clusters in polyaniline from top-down and from bottom-up
Saheb A, Smith JA, Josowicz M, Janata J, Baer DR, Engelhard MH
Journal of Electroanalytical Chemistry, 621(2), 238, 2008
7 Growth and characterization of highly oriented gadolinia-doped ceria (111) thin films on zirconia (111)/sapphire (0001) substrates
Bera D, Kuchibhatla SVNT, Azad S, Saraf L, Wang CM, Shutthanandan V, Nachimuthu P, McCready DE, Engelhard MH, Marina OA, Baer DR, Seal S, Thevuthasan S
Thin Solid Films, 516(18), 6088, 2008
8 Nucleation and growth of MOCVD grown (Cr, Zn) O films - Uniform doping vs secondary phase formation
Saraf LV, Engelhard MH, Nachimuthu P, Shutthanandan V, Wang CM, Heald SM, McCready DE, Lea AS, Baer DR, Chambers SA
Journal of the Electrochemical Society, 154(3), D134, 2007
9 Summary: Update to ASTM guide E 1523 to charge control and charge referencing techniques in x-ray photoelectron spectroscopy
Baer DR
Journal of Vacuum Science & Technology A, 23(3), 577, 2005
10 Simple method for estimating and comparing x-ray damage rates
Baer DR, Engelhard MH, Lea AS, Saraf LV
Journal of Vacuum Science & Technology A, 23(6), 1740, 2005