화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 MBE growth of Topological Isolators based on strained semi-metallic HgCdTe layers
Grendysa J, Tomaka G, Sliz P, Becker CR, Trzyna M, Wojnarowska-Nowak R, Bobko E, Sheregii EM
Journal of Crystal Growth, 480, 1, 2017
2 Transport properties of LiCoPO4 and Fe-substituted LiCoPO4
Allen JL, Thompson T, Sakamoto J, Becker CR, Jow TR, Wolfenstine J
Journal of Power Sources, 254, 204, 2014
3 In situ atomic force microscopy nanoindentation of lithiated silicon nanopillars for lithium ion batteries
McAllister QP, Strawhecker KE, Becker CR, Lundgren CA
Journal of Power Sources, 257, 380, 2014
4 Growth of PbSe on ZnTe/GaAs(211)B by molecular beam epitaxy
Wang XJ, Hou YB, Chang Y, Becker CR, Klie RF, Kodama R, Aqariden F, Sivananthan S
Journal of Crystal Growth, 312(7), 910, 2010
5 Heteroepitaxy of PbSe on GaAs(100) and GaAs(211)B by molecular beam epitaxy
Wang XJ, Hou YB, Chang Y, Becker CR, Klie RF, Kang TW, Sporken R, Sivananthan S
Journal of Crystal Growth, 311(8), 2359, 2009
6 Relation Between Morphology, Etch Rate, Surface Wetting, and Electrochemical Characteristics for Micromachined Silicon Subject to Galvanic Corrosion
Miller DC, Becker CR, Stoldt CR
Journal of the Electrochemical Society, 155(12), F253, 2008
7 Growth of the half-Heusler alloy NiMnSb on (In,Ga)As/InP by molecular beam epitaxy
Bach P, Ruster C, Gould C, Becker CR, Schmidt G, Molenkamp LW
Journal of Crystal Growth, 251(1-4), 323, 2003
8 Molecular beam epitaxial growth of CdMnSe on InAs and AlGaSb
Grabs P, Slobodskyy A, Richter G, Fiederling R, Gould C, Becker CR, Schmidt G, Molenkamp LW
Journal of Crystal Growth, 251(1-4), 347, 2003
9 Ballistic electron emission microscopy studies of ZnSe-BeTe heterojunctions
Chahboun A, Fink V, Fleischauer M, Kavanagh KL, Lu RP, Hansen L, Becker CR, Molenkamp LW
Journal of Vacuum Science & Technology B, 20(4), 1781, 2002
10 MBE growth and characterization of Hg based compounds and heterostructures
Becker CR, Zhang XC, Ortner K, Schmidt J, Pfeuffer-Jeschke A, Latussek V, Gui YS, Daumer V, Liu J, Buhmann H, Landwehr G, Molenkamp LW
Thin Solid Films, 412(1-2), 129, 2002