검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Correlation between the sign of strain and the surface morphology and defect structure of InAlAs grown on vicinal (111)BInP Georgakilas A, Tsagaraki K, Harteros K, Hatzopoulos Z, Vila A, Becourt N, Peiro F, Cornet A, Chrysanthakopoulos N, Calamiotou M Thin Solid Films, 336(1-2), 218, 1998 |
| 2 |
Ionic Contamination in Metal-Oxide-Semiconductor Al/SiO2/3C-SiC Capacitors Raynaud C, Autran JL, Briot JB, Balland B, Becourt N, Jaussaud C Journal of the Electrochemical Society, 142(1), 282, 1995 |