검색결과 : 1건
No. | Article |
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1 |
Characterization of Silicon-Implanted SiO2 Layers Using Positron-Annihilation Spectroscopy Ghislotti G, Nielsen B, Asokakumar P, Lynn KG, Szeles C, Bottani CE, Bertoni S, Cerofolini GF, Meda L Thin Solid Films, 276(1-2), 310, 1996 |