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| No. | Article |
|---|---|
| 1 |
High-precision depth profiling of argon and nitrogen ion etching-induced damage in an AlGaAs/GaAs multiple quantum well structure Otte K, Frost F, Schindler A, Bigl F, Lippold G, Gottschalch V, Flagmeyer RH Thin Solid Films, 318(1-2), 132, 1998 |