검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Depth Profiling of Dopants in Thin Gate Oxides in Complementary Metal-Oxide-Semiconductor Structures by Resonance Ionization Mass-Spectrometry Downey SW, Emerson AB, Georgiou GE, Bevk J, Kistler RC, Moriya N, Jacobson DC, Wise ML Journal of Vacuum Science & Technology B, 13(2), 167, 1995 |
| 2 |
THE INFLUENCE OF A DISPERSION OF PARTICLES ON THE SINTERING OF METAL POWDERS AND WIRES ASHBY MF, BAHK S, BEVK J, TURNBULL D PROGRESS IN MATERIALS SCIENCE, 25(1), 1, 1980 |