화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 In situ characterization of the nitridation of AIII-BV semiconductor surfaces by means of X-ray photoelectron spectroscopy
Hecht JD, Frost F, Chasse T, Hirsch D, Neumann H, Schindler A, Bigl F
Applied Surface Science, 179(1-4), 196, 2001
2 In situ XPS investigations of ion beam hydrogenation of CuInSe2
Otte K, Lippold G, Hirsch D, Chasse T, Schindler A, Yakushev MV, Martin RW, Bigl F
Thin Solid Films, 387(1-2), 185, 2001
3 The influence of ambient temperature on KrF laser ablation of polyimide in air
Braun A, Zimmer K, Bigl F
Applied Surface Science, 154, 73, 2000
4 Combination of different processing methods for the fabrication of 3D polymer structures by excimer laser machining
Zimmer K, Braun A, Bigl F
Applied Surface Science, 154, 601, 2000
5 Combination of contour and half-tone masks used in laser ablation
Braun A, Zimmer K, Bigl F
Applied Surface Science, 168(1-4), 178, 2000
6 XPS and raman investigations of nitrogen ion etching for depth profiling of CuInSe2 and CuGaSe2
Otte K, Lippold G, Hirsch D, Schindler A, Bigl F
Thin Solid Films, 361-362, 498, 2000
7 Low energy ion beam etching of CuInSe2 surfaces
Otte K, Lippold G, Frost A, Schindler A, Bigl F, Yakushev MV, Tomlinson RD
Journal of Vacuum Science & Technology A, 17(1), 19, 1999
8 Smoothing of polycrystalline Cu(ln,Ga)(Se,S)(2) thin films by low-energy ion-beam etching
Frost F, Lippold G, Otte K, Hirsch D, Schindler A, Bigl F
Journal of Vacuum Science & Technology A, 17(3), 793, 1999
9 Investigations of different dry etching methods on LaAlO3
Dienelt J, Zimmer K, Bigl F, Hohne R
Journal of Vacuum Science & Technology A, 17(5), 2531, 1999
10 High-precision depth profiling of argon and nitrogen ion etching-induced damage in an AlGaAs/GaAs multiple quantum well structure
Otte K, Frost F, Schindler A, Bigl F, Lippold G, Gottschalch V, Flagmeyer RH
Thin Solid Films, 318(1-2), 132, 1998