검색결과 : 14건
| No. | Article |
|---|---|
| 1 |
In-situ observations of stress-induced thin film failures Zhao ZB, Hershberger J, Bilello JC Thin Solid Films, 518(8), 2037, 2010 |
| 2 |
Stress anisotropy and stress gradient in magnetron sputtered films with different deposition geometries Zhao ZB, Yalisove SM, Bilello JC Journal of Vacuum Science & Technology A, 24(2), 195, 2006 |
| 3 |
Nanostructured chromium nitride films with a valley of residual stress Zhao ZB, Rek ZU, Yalisove SM, Bilello JC Thin Solid Films, 472(1-2), 96, 2005 |
| 4 |
In situ x-ray diffraction observation of multiple texture turnovers in sputtered Cr films Zhao ZB, Rek ZU, Yalisove SM, Bilello JC Journal of Vacuum Science & Technology A, 22(6), 2365, 2004 |
| 5 |
In situ observations of the real-time stress-evolution and delamination of thin Ta films on Si(100) French BL, Bilello JC Thin Solid Films, 446(1), 91, 2004 |
| 6 |
Nature of the as-deposited state of AlCuFeCrPVD coatings Daniels MJ, King D, Phillips B, Zabinski JS, Bilello JC Thin Solid Films, 440(1-2), 87, 2003 |
| 7 |
Real-time/in situ diffraction study of phase and microstructural evolution in sputtered beta-Ta/Ta2O5 films (vol 19, 2910, 2001) Whitacre JF, Yalisove SM, Bilello JC Journal of Vacuum Science & Technology A, 20(4), 1505, 2002 |
| 8 |
Determination of residual stress in thin films: a comparative study of X-ray topography versus laser curvature method Zhao ZB, Hershberger J, Yalisove SM, Bilello JC Thin Solid Films, 415(1-2), 21, 2002 |
| 9 |
Real-time/in situ diffraction study of phase and microstructural evolution in sputtered beta-Ta/Ta2O5 films Whitacre JF, Yalisove SM, Bilello JC Journal of Vacuum Science & Technology A, 19(6), 2910, 2001 |
| 10 |
Strain Gradients and Normal Stresses in Textured Mo Thin-Films Malhotra SG, Rek ZU, Yalisove SM, Bilello JC Journal of Vacuum Science & Technology A, 15(2), 345, 1997 |