검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Field passivation of the silicon wafer rear surface for reliable bulk recombination lifetime measurement Boehringer M, Augke R Journal of the Electrochemical Society, 155(7), H474, 2008 |
| 2 |
In-line copper contamination monitoring using noncontact Q-VSPV techniques Boehringer M, Hauber J, Passefort S, Eason K Journal of the Electrochemical Society, 152(1), G1, 2005 |