화학공학소재연구정보센터
검색결과 : 13건
No. Article
1 Confined selective lateral epitaxial growth of 16-nm thick Ge nanostructures on SOI substrates: Advantages and challenges
Khazaka R, Bogumilowicz Y, Rouchon D, Boutry H, Chalupa Z, Lapras V, Previtali B, Chevalier N, Papon AM, David S, Maitrejean S
Applied Surface Science, 445, 77, 2018
2 Anti phase boundary free GaSb layer grown on 300 mm (001)-Si substrate by metal organic chemical vapor deposition
Cerba T, Martin M, Moeyaert J, David S, Rouviere JL, Cerutti L, Alcotte R, Rodriguez JB, Bawedin M, Boutry H, Bassani F, Bogumilowicz Y, Gergaud P, Tournie E, Baron T
Thin Solid Films, 645, 5, 2018
3 Low temperature growth and physical properties of InAs thin films grown on Si, GaAs and In0.53Ga0.47As template
Alcotte R, Martin M, Moeyaert J, Gergaud P, David S, Cerba T, Bassani F, Ducroquet F, Bogumilowicz Y, Baron T
Thin Solid Films, 645, 119, 2018
4 Threading dislocations in GaAs epitaxial layers on various thickness Ge buffers on 300 mm Si substrates
Bogumilowicz Y, Hartmann JM, Rochat N, Salaun A, Martin M, Bassani F, Baron T, David S, Bao XY, Sanchez E
Journal of Crystal Growth, 453, 180, 2016
5 Reduced-pressure chemical vapor deposition of boron-doped Si and Ge layers
Bogumilowicz Y, Hartmann JM
Thin Solid Films, 557, 4, 2014
6 Direct Bonding of Silicon to Platinum
Dargent L, Bogumilowicz Y, Renault O, Ghyselen B, Madar R, Clavelier L
Journal of the Electrochemical Society, 158(3), H255, 2011
7 High-temperature growth of very high germanium content SiGe virtual substrates
Bogumilowicz Y, Hartmann JM, Di Nardo C, Holliger P, Papon AM, Rolland G, Billon T
Journal of Crystal Growth, 290(2), 523, 2006
8 Performance and physics of sub-50 nm strained Si on Si1-xGex-on-insulator (SGOI) nMOSFETs
Andrieu F, Ernst T, Faynot O, Rozeau O, Bogumilowicz Y, Hartmann JM, Brevard L, Toffoli A, Lafond D, Ghyselen B, Fournel F, Ghibaudo G, Deleonibus S
Solid-State Electronics, 50(4), 566, 2006
9 SiGe high-temperature growth kinetics in reduced pressure-chemical vapor deposition
Bogumilowicz Y, Hartmann JM, Rolland G, Billon T
Journal of Crystal Growth, 274(1-2), 28, 2005
10 Reduced pressure-chemical vapor deposition of intrinsic and doped Ge layers on Si(001) for microelectronics and optoelectronics purposes
Hartmann JM, Damlencourt JF, Bogumilowicz Y, Holliger P, Rolland G, Billon T
Journal of Crystal Growth, 274(1-2), 90, 2005