검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Use of angle resolved x-ray photoelectron spectroscopy for determination of depth and thickness of compound layer structures Spruytte S, Coldren C, Harris J, Pantelidis D, Lee HJ, Bravman J, Kelly M Journal of Vacuum Science & Technology A, 19(2), 603, 2001 |