검색결과 : 47건
| No. | Article |
|---|---|
| 1 |
Direct observation of a two-dimensional hole gas at oxide interfaces Lee H, Campbell N, Lee J, Asel TJ, Paudel TR, Zhou H, Lee JW, Noesges B, Seo J, Park B, Brillson LJ, Oh SH, Tsymbal EY, Rzchowski MS, Eom CB Nature Materials, 17(3), 231, 2018 |
| 2 |
X-ray photoemission spectroscopy of Sr2FeMoO6 film stoichiometry and valence state Rutkowski M, Hauser AJ, Yang FY, Ricciardo R, Meyer T, Woodward PM, Holcombe A, Morris PA, Brillson LJ Journal of Vacuum Science & Technology A, 28(5), 1240, 2010 |
| 3 |
Polarity-related asymetry at ZnO surfaces and metal interfaces Dong YF, Fang ZQ, Look DC, Doutt DR, Hetzer MJ, Brillson LJ Journal of Vacuum Science & Technology B, 27(3), 1710, 2009 |
| 4 |
Surface, bulk, and interface electronic states of epitaxial BiFeO3 films Zhang J, Rutkowski M, Martin LW, Conry T, Ramesh R, Ihlefeld JF, Melville A, Schlom DG, Brillson LJ Journal of Vacuum Science & Technology B, 27(4), 2012, 2009 |
| 5 |
Surface and near-surface passivation, chemical reaction, and Schottky barrier formation at ZnO surfaces and interfaces Brillson LJ, Mosbacker HL, Hetzer MJ, Strzhemechny Y, Look DC, Cantwell G, Zhang J, Song JJ Applied Surface Science, 254(24), 8000, 2008 |
| 6 |
Atomic diffusion and interface electronic structure at In0.49Ga0.51P/GaAs heterojunctions Smith PE, Lueck M, Ringel SA, Brillson LJ Journal of Vacuum Science & Technology B, 26(1), 89, 2008 |
| 7 |
Low energy electron-excited nanoscale luminescence spectroscopy studies of intrinsic defects in HfO2 and SiO2-HfO2-SiO2-Si stacks Strzhemechny YM, Bataiev M, Tumakha SP, Goss SH, Hinkle CL, Fulton CC, Lucovsky G, Brillson LJ Journal of Vacuum Science & Technology B, 26(1), 232, 2008 |
| 8 |
Depth-resolved cathodoluminescence spectroscopy study of defects in SrTiO3 Zhang J, Walsh S, Brooks C, Schlom DG, Brillson LJ Journal of Vacuum Science & Technology B, 26(4), 1466, 2008 |
| 9 |
Impact of near-surface native point defects, chemical reactions, and surface morphology on ZnO interfaces Doutt DR, Zgrabik C, Mosbacker HL, Brillson LJ Journal of Vacuum Science & Technology B, 26(4), 1477, 2008 |
| 10 |
Interface bonding, chemical reactions, and defect formation at metal-semiconductor interfaces Brillson LJ Journal of Vacuum Science & Technology A, 25(4), 943, 2007 |