검색결과 : 22건
No. | Article |
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1 |
Crack arrest in thin metallic film stacks due to material- and residual stress inhomogeneities Kozic D, Ganser HP, Brunner R, Kiener D, Antretter T, Kolednik O Thin Solid Films, 668, 14, 2018 |
2 |
About the optical properties of oxidized black silicon structures Pincik E, Brunner R, Kobayashi H, Mikula M, Kucera M, Svec P, Gregus J, Vojtek P, Zabudla Z, Imamura K, Zahoran M Applied Surface Science, 395, 185, 2017 |
3 |
Properties of HfO2/ultrathin SiO2/Si structures and their comparison with Si MOS structures passivated in KCN solution Pincik E, Kobayashi H, Matsumoto T, Takahashi M, Mikula M, Brunner R Applied Surface Science, 301, 34, 2014 |
4 |
Critical assessment of the determination of residual stress profiles in thin films by means of the ion beam layer removal method Schoengrundner R, Treml R, Antretter T, Kozic D, Ecker W, Kiener D, Brunner R Thin Solid Films, 564, 321, 2014 |
5 |
About electrical properties of passivated SiO2/Si structures prepared electro-chemically in HClO4 solutions Pincik E, Kobayashi H, Rusnak J, Takahashi M, Brunner R Applied Surface Science, 269, 148, 2013 |
6 |
Increasing the Order Parameter of Quasi-Hexagonal Micellar Nanostructures by Ultrasound Annealing Williges C, Chen WW, Morhard C, Spatz JP, Brunner R Langmuir, 29(4), 989, 2013 |
7 |
Passivation of Si-based structures in HCN and KCN solutions Pincik E, Kobayashi H, Rusnak J, Takahashi M, Mikula M, Kim WB, Kucera M, Brunner R, Jurecka S Applied Surface Science, 258(21), 8397, 2012 |
8 |
Tunable Guided-Mode Resonance Grating Filter Szeghalmi A, Helgert M, Brunner R, Heyroth F, Gosele U, Knez M Advanced Functional Materials, 20(13), 2053, 2010 |
9 |
On photoluminescence properties of a-Si:H-based structures Brunner R, Pincik E, Kobayashi H, Kucera M, Takahashi M, Rusnak J Applied Surface Science, 256(18), 5596, 2010 |
10 |
On ultra-thin oxide/Si and very-thin oxide/Si structures prepared by wet chemical process Pincik E, Kobayashi H, Rusnak J, Kim WB, Brunner R, Malinovsky L, Matsumoto T, Imamura K, Jergel M, Takahashi M, Higashi Y, Kucera M, Mikula M Applied Surface Science, 256(19), 5757, 2010 |