화학공학소재연구정보센터
검색결과 : 32건
No. Article
1 Morphology and magnetic properties of the ethylene-co-vinyl acetate/iron nanocomposite films prepared by implantation with Fe6+ ions
Bozanic DK, Draganic I, Bibic N, Luyt AS, Konstantinovic Z, Djokovic V
Applied Surface Science, 378, 362, 2016
2 Dependence of multiply charged ions on the polarization state in nanosecond laser-benzene cluster interaction
Wang WG, Zhao WD, Hua L, Hou KY, Li HY
Chemical Physics Letters, 652, 239, 2016
3 Surface modifications of BaF2 and CaF2 single crystals by slow highly charged ions
El-Said AS, Heller R, Wilhelm RA, Facsko S, Aumayr F
Applied Surface Science, 310, 169, 2014
4 Generation of multiply charged atomic ions of halogens using second harmonic of nanosecond Nd : YAG laser
Sharma P, Vatsa RK
Current Applied Physics, 9(1), 140, 2009
5 Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O-2(+) bombardment
Franzreb K, Williams P, Lorincik J, Sroubek Z
Applied Surface Science, 203, 39, 2003
6 Architecture and solution properties of amphiphilic polymer brushes with peripheral charged ions
Ishizu K, Toyoda K, Furukawa T, Uchida S
Journal of Colloid and Interface Science, 261(2), 552, 2003
7 Electron Capture in Collisions of Slow Highly Charged Ions with an Atom and a Molecule: Processes and Fragmentation Dynamics
Fremont F, Laurent G, Rangama J, Sobocinski P, Tarisien M, Adoui L, Cassimi A, Chesnel JY, Flechard X, Hennecart D, Husson X
International Journal of Molecular Sciences, 3(3), 115, 2002
8 Studies of Electron Capture by Multiply Charged Ions from Molecules using Translational Energy Spectroscopy
Kearns DM, McCullough RW, Gilbody HB
International Journal of Molecular Sciences, 3(3), 162, 2002
9 Single Electron Capture in Slow Collisions of Doubly Charged Ions with Dinuclear Molecules
Albu M, Mrazek L, Aumayr F, Winter H
International Journal of Molecular Sciences, 3(3), 209, 2002
10 Ultrathin SiO2 layers formation by ultraslow single- and multicharged ions
Borsoni G, Le Roux V, Laffitte R, Kerdiles S, Bechu N, Vallier L, Korwin-Pawlowski ML, Vannuffel C, Bertin F, Vergnaud C, Chabli A, Wyon C
Solid-State Electronics, 46(11), 1855, 2002