화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Development of Cat-CVD apparatus - a method to control wafer temperatures under thermal influence of heated catalyzer
Karasawa M, Masuda A, Ishibashi K, Matsumura H
Thin Solid Films, 395(1-2), 71, 2001
2 Plasma and Processing Effects of Electrode Spacing for Tungsten Etchback Using a Bipolar Electrostatic Wafer Clamp
Marx WF, Ra YJ, Yang R, Chen CH
Journal of Vacuum Science & Technology A, 12(6), 3087, 1994