검색결과 : 11건
No. | Article |
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1 |
Four-Stranded Coiled-Coil Elastic Protein in the Byssus of the Giant Clam, Tridacna maxima Miserez A, Li YL, Cagnon J, Weaver JC, Waite JH Biomacromolecules, 13(2), 332, 2012 |
2 |
Erratum: Charged Defect Quantification in Pt/Al2O3/In0.53Ga0.47As/InP MOS Capacitors (vol 158, pg G103, 2011) Long RD, Shin B, Monaghan S, Cherkaoui K, Cagnon J, Stemmer S, McIntyre PC, Hurley PK Journal of the Electrochemical Society, 159(6), S17, 2012 |
3 |
Charged Defect Quantification in Pt/Al2O3/In0.53Ga0.47As/InP MOS Capacitors Long RD, Shin B, Monaghan S, Cherkaoui K, Cagnon J, Stemmer S, McIntyre PC, Hurley PK Journal of the Electrochemical Society, 158(5), G103, 2011 |
4 |
Unpinned Interface Between Al2O3 Gate Dielectric Layer Grown by Atomic Layer Deposition and Chemically Treated n-In0.53Ga0.47As(001) Shin B, Cagnon J, Long RD, Hurley PK, Stemmer S, McIntyre PC Electrochemical and Solid State Letters, 12(8), G40, 2009 |
5 |
High-quality III-V semiconductor MBE growth on Ge/Si virtual substrates for metal-oxide-semiconductor device fabrication Choi DH, Harris JS, Kim E, McIntyre PC, Cagnon J, Stemmer S Journal of Crystal Growth, 311(7), 1962, 2009 |
6 |
Microstructure of epitaxial rutile TiO2 films grown by molecular beam epitaxy on r-plane Al2O3 Engel-Herbert R, Jalan B, Cagnon J, Stemmer S Journal of Crystal Growth, 312(1), 149, 2009 |
7 |
Growth modes in metal-organic molecular beam epitaxy of TiO2 on r-plane sapphire Jalan B, Engel-Herbert R, Cagnon J, Stemmer S Journal of Vacuum Science & Technology A, 27(2), 230, 2009 |
8 |
Analysis of carbon in SrTiO3 grown by hybrid molecular beam epitaxy Jalan B, Cagnon J, Mates TE, Stemmer S Journal of Vacuum Science & Technology A, 27(6), 1365, 2009 |
9 |
Low surface roughness and threading dislocation density Ge growth on Si (001) Choi D, Ge YS, Harris JS, Cagnon J, Stemmer S Journal of Crystal Growth, 310(18), 4273, 2008 |
10 |
Atomic Layer Deposition of Hafnium Oxide on Ge and GaAs Substrates: Precursors and Surface Preparation Delabie A, Brunco DP, Conard T, Favia P, Bender H, Franquet A, Sioncke S, Vandervorst W, Van Elshocht S, Heyns M, Meuris M, Kim E, McIntyre PC, Saraswat KC, LeBeau JM, Cagnon J, Stemmer S, Tsai W Journal of the Electrochemical Society, 155(12), H937, 2008 |