검색결과 : 1건
No. | Article |
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1 |
Effect of passivation on device stability and gate reverse characteristics on 4H-SiC MESFETs Kerlain A, Morvan E, Dua C, Caillas N, Brylinski C Materials Science Forum, 457-460, 1177, 2004 |
No. | Article |
---|---|
1 |
Effect of passivation on device stability and gate reverse characteristics on 4H-SiC MESFETs Kerlain A, Morvan E, Dua C, Caillas N, Brylinski C Materials Science Forum, 457-460, 1177, 2004 |