검색결과 : 3건
No. | Article |
---|---|
1 |
2-Dimensional Junction Profiling by Selective Chemical Etching - Applications to Electron Device Characterization Spinella C, Raineri V, Lavia F, Campisano SU Journal of Vacuum Science & Technology B, 14(1), 414, 1996 |
2 |
Characterization by X-Ray Photoelectron-Spectroscopy of the Chemical-Structure of Semiinsulating Polycrystalline Silicon Thin-Films Iacona F, Lombardo S, Campisano SU Journal of Vacuum Science & Technology B, 14(4), 2693, 1996 |
3 |
Selective Etching of B-Doped Silicon - Mechanisms and 2-Dimensional Delineation of Concentration Profiles Spinella C, Raineri V, Campisano SU Journal of the Electrochemical Society, 142(5), 1601, 1995 |