검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Spectroscopic ellipsometric characterization of transparent thin film amorphous electronic materials : integrated analysis Popov KV, Tikhonravov AV, Campmany J, Bertran E, Bosch S, Canillas A Thin Solid Films, 313-314, 379, 1998 |
| 2 |
Application of infrared Fourier transform phase-modulated ellipsometry to the characterization of silicon-based amorphous thin films Canillas A, Pascual E, Andujar JL, Campmany J, Bertran E Thin Solid Films, 313-314, 671, 1998 |