화학공학소재연구정보센터
검색결과 : 16건
No. Article
1 Retrieval of the non-depolarizing components of depolarizing Mueller matrices by using symmetry conditions and least squares minimization
Kuntman E, Canillas A, Arteaga O
Applied Surface Science, 421, 697, 2017
2 Heterogeneous distribution of B-site cations in BaZrxT1-xO3 epitaxial thin films grown on (001) SrTiO3 by pulsed laser deposition
Ventura J, Polo C, Ferrater C, Hernandez S, Sancho-Parramon J, Coy LE, Rodriguez L, Canillas A, Fabrega L, Varela M
Applied Surface Science, 381, 12, 2016
3 Transmission ellipsometry of anisotropic substrates and thin films at oblique incidence. Handling multiple reflections
Arteaga O, Freudenthal J, Nichols S, Canillas A, Kahr B
Thin Solid Films, 571, 701, 2014
4 Alignment and Chirality of Porphyrin J Aggregates Formed at the Liquid-Liquid Interface of a Centrifugal Liquid Membrane Cell
Takechi H, Canillas A, Ribo JM, Watarai H
Langmuir, 29(24), 7249, 2013
5 Transmission Mueller matrix ellipsometry of chirality switching phenomena
Aiteaga O, El-Hachemi Z, Canillas A, Ribo JM
Thin Solid Films, 519(9), 2617, 2011
6 Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
Barroso F, Bosch S, Tort N, Arteaga O, Sancho-Parramon J, Jover E, Bertran E, Canillas A
Thin Solid Films, 519(9), 2801, 2011
7 Optical characterization of colloidal crystals based on dissymmetric metal-coated oxide submicrospheres
Portal S, Vallve MA, Arteaga O, Ignes-Mullol J, Canillas A, Bertran E
Thin Solid Films, 517(3), 1053, 2008
8 Optical characterization of ns-SiN : H in the infrared by spectroscopic ellipsometry
Sancho-Parramon J, Bosch S, Canillas A
Applied Surface Science, 253(1), 65, 2006
9 FTIR phase-modulated ellipsometry characterization of hydrogenated amorphous silicon nitride thin films with embedded nanoparticles
Canillas A, Pinyol A, Sancho-Parramon J, Ferre-Borrull J, Bertran E
Thin Solid Films, 455-56, 167, 2004
10 Visible and infrared ellipsometry applied to the study of metal-containing diamond-like carbon coatings
Corbella C, Pascual E, Canillas A, Bertran E, Andujar JL
Thin Solid Films, 455-56, 370, 2004