검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Reactive bipolar pulsed dual magnetron sputtering of ZrN films: The effect of duty cycle Rizzo A, Valerini D, Capodieci L, Mirenghi L, Di Benedetto F, Protopapa ML Applied Surface Science, 427, 994, 2018 |
| 2 |
Aluminum-doped zinc oxide coatings on polylactic acid films for antimicrobial food packaging Valerini D, Tammaro L, Di Benedetto F, Vigliotta G, Capodieci L, Terzi R, Rizzo A Thin Solid Films, 645, 187, 2018 |
| 3 |
Electrophoretically Deposited Polymeric Films: Evidence of Correlation between Electrochemical Impedance Spectroscopy Measurements and Morphological Properties De Riccardis MF, Carbone D, Capodieci L Journal of the Electrochemical Society, 162(11), D3071, 2015 |
| 4 |
Effect of the substrate temperature on zirconium oxynitride thin films deposited by water vapour-nitrogen radiofrequency magnetron sputtering Signore MA, Rizzo A, Tapfer L, Piscopiello E, Capodieci L, Cappello A Thin Solid Films, 518(8), 1943, 2010 |
| 5 |
Influence of growth rate on the structural and morphological properties of TiN, ZrN and TiN/ZrN multilayers Rizzo A, Signore MA, De Riccardis MF, Capodieci L, Dimaio D, Nocco T Thin Solid Films, 515(17), 6665, 2007 |
| 6 |
Screening layouts for high-numerical aperture and polarization effects using pattern matching McIntyre GR, Holwill J, Neureuther A, Capodieci L, Zou Y, Levinson H, Kye J Journal of Vacuum Science & Technology B, 23(6), 2646, 2005 |
| 7 |
Effects of chrome pattern characteristics on image placement due to thermomechanical distortion of optical reticles during exposure Abdo A, Capodieci L, Lalovic I, Engelstad R Journal of Vacuum Science & Technology B, 21(6), 3052, 2003 |
| 8 |
Novel methodology for postexposure bake calibration and optimization based on electrical linewidth measurement and process metamodeling Capodieci L, Subramanian R, Rangarajan B, Heavlin WD, Li JW, Bernard DA, Boksha VV Journal of Vacuum Science & Technology B, 16(6), 3752, 1998 |
| 9 |
Extendibility of X-Ray-Lithography to Less-Than-or-Equal-to-130 nm Ground Rules in Complex Integrated-Circuit Patterns Hector S, Chu W, Thompson M, Pol V, Dauksher B, Cummings K, Resnick D, Pendharkar S, Maldonado J, Mccord M, Krasnoperova A, Liebmann L, Silverman J, Guo J, Khan M, Bollepalli S, Capodieci L, Cerrina F Journal of Vacuum Science & Technology B, 14(6), 4288, 1996 |
| 10 |
Novel Postexposure Bake Simulator - First Results Capodieci L, Krasnoperova A, Cerrina F, Lyons C, Spence C, Early K Journal of Vacuum Science & Technology B, 13(6), 2963, 1995 |