검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Understanding lead iodide perovskite hysteresis and degradation causes by extensive electrical characterization Rizzo A, Lamberti F, Buonomo M, Wrachien N, Torto L, Lago N, Sansoni S, Pilot R, Prato M, Michieli N, Meneghetti M, Meneghesso G, Cester A Solar Energy Materials and Solar Cells, 189, 43, 2019 |
| 2 |
Reverse bias degradation of metal wrap through silicon solar cells Barbato M, Barbato A, Meneghini M, Cester A, Mura G, Tonini D, Voltan A, Cellere G, Meneghesso G Solar Energy Materials and Solar Cells, 147, 288, 2016 |
| 3 |
Characterization and modeling of organic (P3HT:PCBM) solar cells as a function of bias and illumination Rizzo A, Cester A, Wrachien N, Lago N, Torto L, Barbato M, Favaro J, Gevorgyan SEA, Corazza M, Krebs FC Solar Energy Materials and Solar Cells, 157, 337, 2016 |
| 4 |
Reliability study of organic complementary logic inverters using constant voltage stress Wrachie N, Cester A, Lago N, Rizzo A, D'Alpaos R, Stefani A, Turatti G, Muccini M, Meneghesso G Solid-State Electronics, 113, 151, 2015 |
| 5 |
Worldwide outdoor round robin study of organic photovoltaic devices and modules Madsen MV, Gevorgyan SA, Pacios R, Ajuria J, Etxebarria I, Kettle J, Bristow ND, Neophytou M, Choulis SA, Roman LS, Yohannes T, Cester A, Cheng P, Zhan XW, Wu J, Xie ZY, Tu WC, He JH, Fell CJ, Anderson K, Hermenau M, Bartesaghi D, Koster LJA, Machui F, Gonzalez-Valls I, Lira-Cantu M, Khlyabich PP, Thompson BC, Gupta R, Shanmugam K, Kulkarni GU, Galagan Y, Urbina A, Abad J, Roesch R, Hoppe H, Morvillo P, Bobeico E, Panaitescu E, Menon L, Luo Q, Wu ZW, Ma CQ, Hambarian A, Melikyan V, Hambsch M, Burn PL, Meredith P, Rath T, Dunst S, Trimmel G, Bardizza G, Mullejans H, Goryachev AE, Misra RK, Katz EA, Takagi K, Magaino S, Saito H, Aoki D, Sommeling PM, Kroon JM, Vangerven T, Manca J, Kesters J, Maes W, Bobkova OD, Trukhanov VA, Paraschuk DY, Castro FA, Blakesley J, Tuladhar SM, Rohr JA, Nelson J, Xia JB, Parlak EA, Tumay TA, Egelhaaf HJ, Tanenbaum DM, Ferguson GM, Carpenter R, Chen HZ, Zimmermann B, Hirsch L, Wantz G, Sun ZQ, Singh P, Bapat C, Offermans T, Krebs FC Solar Energy Materials and Solar Cells, 130, 281, 2014 |
| 6 |
Implanted and irradiated SiO2/Si structure electrical properties at the nanoscale Porti M, Nafria N, Gerardin S, Aymerich X, Cester A, Paccagnella A, Ghidini G Journal of Vacuum Science & Technology B, 27(1), 421, 2009 |
| 7 |
Stress induced leakage current under pulsed voltage stress Cester A, Paccagnella A, Ghidini G Solid-State Electronics, 46(3), 399, 2002 |
| 8 |
Soft breakdown current noise in ultra-thin gate oxides Cester A, Bandiera L, Ghidini G, Bloom I, Paccagnella A Solid-State Electronics, 46(7), 1019, 2002 |
| 9 |
Time decay of stress induced leakage current in thin gate oxides by low-field electron injection Cester A, Paccagnella A, Ghidini G Solid-State Electronics, 45(8), 1345, 2001 |