검색결과 : 2건
No. | Article |
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1 |
A new field dependent mobility model for high frequency channel thermal noise of deep submicron RFCMOS Ong SN, Yeo KS, Chew KWJ, Chan LHK, Loo XS, Boon CC, Do MA Solid-State Electronics, 68, 32, 2012 |
2 |
Impact of velocity saturation and hot carrier effects on channel thermal noise model of deep sub-micron MOSFETs Ong SN, Yeo KS, Chew KWJ, Chan LHK, Loo XS, Boon CC, Do MA Solid-State Electronics, 72, 8, 2012 |