화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 A new field dependent mobility model for high frequency channel thermal noise of deep submicron RFCMOS
Ong SN, Yeo KS, Chew KWJ, Chan LHK, Loo XS, Boon CC, Do MA
Solid-State Electronics, 68, 32, 2012
2 Impact of velocity saturation and hot carrier effects on channel thermal noise model of deep sub-micron MOSFETs
Ong SN, Yeo KS, Chew KWJ, Chan LHK, Loo XS, Boon CC, Do MA
Solid-State Electronics, 72, 8, 2012