검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Quantitative analysis of tungsten, oxygen and carbon concentrations in the microcrystalline silicon films deposited by hot-wire CVD Bouree JE, Guillet J, Grattepain C, Chaumont J Thin Solid Films, 430(1-2), 110, 2003 |
| 2 |
Quantitative analysis of tungsten, oxygen and carbon concentrations in the microcrystalline silicon films deposited by hot-wire CVD (vol 430, pg 110, 2003) Bouree JE, Guillet J, Grattepain C, Chaumont J Thin Solid Films, 440(1-2), 294, 2003 |
| 3 |
Erbium Doping of Si via Ion-Beam-Induced Epitaxial Crystallization - Another Route to Room-Temperature Photoluminescence Clerc C, Bernas H, Chaumont J, Boucaud P, Julien F, Lourtioz JM Thin Solid Films, 294(1-2), 223, 1997 |