검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
SIMS characterisation of chemical solution deposited thin film systems of BaTiO3/X (X=LaNiO3, La0.5Sr0.5CoO3, La0.7Sr0.3MnO3) on a platinised silicon wafer Pollak C, Busic A, Reichmann K, Hutter H Thin Solid Films, 405(1-2), 218, 2002 |
| 2 |
용출곡선법과 Frontal Analysis를 이용한 Langmuir 흡착평형식의 측정 최용석, 이종호, 노경호 Journal of the Korean Industrial and Engineering Chemistry, 10(5), 672, 1999 |