검색결과 : 2건
No. | Article |
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1 |
Resurrecting dirty atomic force microscopy calibration standards Chernoff DA, Sherman R Journal of Vacuum Science & Technology B, 28(3), 643, 2010 |
2 |
Automated, high precision measurement of critical dimensions using the atomic force microscope Chernoff DA, Burkhead DL Journal of Vacuum Science & Technology A, 17(4), 1457, 1999 |