검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Si1-xGex/Si Valence-Band Offset Determination Using Current-Voltage Characteristics Chretien O, Apetz R, Souifi A, Vescan L Thin Solid Films, 294(1-2), 198, 1997 |
| No. | Article |
|---|---|
| 1 |
Si1-xGex/Si Valence-Band Offset Determination Using Current-Voltage Characteristics Chretien O, Apetz R, Souifi A, Vescan L Thin Solid Films, 294(1-2), 198, 1997 |