검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Nanoscale elemental imaging of semiconductor materials using focused ion beam secondary ion mass spectrometry Stevie FA, Downey SW, Brown SR, Shofner TL, Decker MA, Dingle T, Christman L Journal of Vacuum Science & Technology B, 17(6), 2476, 1999 |
| 2 |
A Focused Ion-Beam Secondary-Ion Mass-Spectroscopy System Crow GA, Christman L, Utlaut M Journal of Vacuum Science & Technology B, 13(6), 2607, 1995 |